Calvin Quate

Calvin Forrest Quate was born in Baker, Nevada, on December 7, 1923. He served in the U.S. Navy during World War II before earning a bachelor's degree in electrical engineering from the University of Utah in 1944. He later received his Ph.D. in electrical engineering from Stanford University in 1950, where he would spend most of his academic career.¹

Quate joined the faculty at Stanford in 1950, becoming a professor of applied physics and electrical engineering. His early research focused on microwave acoustics and the interaction of electrons with acoustic waves, leading to the development of acoustic microscopes that use high-frequency sound to image materials.

In 1986, Quate, along with Gerd Binnig and Christoph Gerber, invented the atomic force microscope (AFM). The AFM works by scanning a sharp tip across a surface, measuring the forces between the tip and the sample to create a topographical image at atomic resolution. Unlike the scanning tunneling microscope (STM), the AFM can image non-conducting materials, making it invaluable in biology and materials science.²

Quate continued to innovate, developing the scanning capacitance microscope and contributing to the field of microelectromechanical systems (MEMS). He also worked on acoustic wave devices and piezoelectric materials, holding over 100 patents.³

Beyond the AFM, Quate made significant contributions to acoustic microscopy, which uses sound waves to image subsurface features. He also played a key role in the development of the scanning electron microscope (SEM) at Stanford in the 1960s. Quate was known for his mentorship, guiding many students who became leaders in nanotechnology. He was also an avid outdoorsman and a supporter of the arts.⁴

Quate received numerous accolades, including the National Medal of Science in 1992, the IEEE Medal of Honor in 2000, and the Kyoto Prize in 2004. He was a member of the National Academy of Sciences and the National Academy of Engineering.

Atomic force microscope (AFM)

A type of scanning probe microscope that measures forces between a sharp tip and a sample to produce high-resolution images.

Scanning tunneling microscope (STM)

A microscope that images surfaces using quantum tunneling of electrons; requires conductive samples.

Acoustic microscopy

A technique using high-frequency sound waves to image the interior of materials.

MEMS

Microelectromechanical systems; tiny mechanical devices driven by electricity.